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Geological Applications of SIMS

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Secondary Ion Mass Spectrometry SIMS IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

Abstract

In geology, SIMS is applied mainly to trace element and isotopic analysis rather than surface analysis or depth profiling. Good spatial resolution is desirable, hence the instruments used are generally of the ion probe type, with primary beam focussed to a few μm. The image-forming type of instrument (ion microscope) can also be used, in which case a small part of the image may be selected for ‘spot’ analysis. Molecular interferences necessitate high mass resolution in many geological applications, hence double-focussing magnetic-sector mass spectrometers are favoured in preference to the simpler quadrupole type.

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Author information

Authors and Affiliations

  1. Department of Earth Sciences, University of Cambridge, Downing St., Cambridge, CB2 3EQ, England

    S. J. B. Reed

Authors
  1. S. J. B. Reed
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Editor information

Editors and Affiliations

  1. Phsysikalisches Inst., Universität Münster, Münster, D-4400, Fed. Rep. of Germany

    A. Benninghoven

  2. College of General Education, Osaka University, Osaka 560, Japan

    J. Okano

  3. Department of Applied Physics, Osaka University, Osaka 565, Japan

    R. Shimizu

  4. Philips Research Laboratories, Eindhoven, The Netherlands

    H. W. Werner

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© 1984 Springer-Verlag Berlin Heidelberg

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Reed, S.J.B. (1984). Geological Applications of SIMS. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_117

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_117

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

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