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Pictorial Pattern Recognition for Industrial Inspection

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Pictorial Data Analysis

Part of the book series: NATO ASI Series ((NATO ASI F,volume 4))

Abstract

Three major approaches to pattern recognition, (1) template matching, (2) decision-theoretic approach, and (3) structural and syntactic approach, are briefly introduced. The application of these approaches to automatic visual inspection of manufactured products are then reviewed. A more general method for automatic visual inspection of IC chips is then proposed. Several practical examples are included for illustration.

This work was supported by the National Science Foundation Grant ECS 81-19886.

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Author information

Authors and Affiliations

  1. School of Electrical Engineering, Purdue University, W. Lafayette, Indiana, 47907, USA

    K. S. Fu

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  1. K. S. Fu
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Editor information

Editors and Affiliations

  1. Electrical Engineering and Computer Science Departments, Virginia Polytechnic Institute and State University Spatial Data Analysis Lab., Blacksburg, VA, 24061, USA

    Robert M. Haralick

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© 1983 Springer-Verlag Berlin Heidelberg

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Fu, K.S. (1983). Pictorial Pattern Recognition for Industrial Inspection. In: Haralick, R.M. (eds) Pictorial Data Analysis. NATO ASI Series, vol 4. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82017-5_16

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  • DOI: https://doi.org/10.1007/978-3-642-82017-5_16

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82019-9

  • Online ISBN: 978-3-642-82017-5

  • eBook Packages: Springer Book Archive

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