RADC Failure Rate Prediction Methodology — Today and Tomorrow

  • Peter F. Manno
Conference paper
Part of the NATO ASI Series book series (volume 3)


The failure rate and Mean Time Between Failure (MTBF) prediction capabilities are essential in the development and maintenance of reliable electronic equipments/systems. Predictions performed during the design phase yield early estimates of the anticipated equipment reliability which provides a quantitative basis for design trade-off analyses, reliability-growth monitoring, and life-cycle cost studies. The microcircuit reliability prediction techniques, presented in MIL-HDBK-217D, “Reliability Prediction of Electronic Equipment,” are reasonably accurate for a variety of device technologies over the Small Scale Integration (SSI), Medium Scale Integration (MSI), and Large Scale Integration (LSI) complexity range.


Failure Rate Reliability Prediction Metal Oxide Semiconductor Very Large Scale Integrate Large Scale Integration 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Berlin Heidelberg 1983

Authors and Affiliations

  • Peter F. Manno
    • 1
  1. 1.Rome Air Development CenterGriffiss AFBUSA

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