Abstract
A magnetic lens is defined as an axisymmetric magnetic field existing in a finite axial interval between two field-free regions. The effect of saturation of the shielding material on the axial field distribution is discussed. Parameters describing lens strength and field form are defined, and scaling laws discussed. Results of numerical field calculations are given together with analytical models for symmetrical and asymmetrical lens fields. Field models are presented for which the paraxial trajectory equation can be solved analytically. A review is given of the paraxial properties, such as focal lengths, focal positions and chromatic aberration coefficients, and their dependence on lens strength and gap-bore ratio defining their field form, as well as unified representations in which each of these dependences is approximately described by one single curve in which the lens size and the gap-bore ratio occur only in the horizontal and vertical scales. A classification of third-order aberrations is given together with their unified representations for the limiting case of high magnification.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
J. Barthère, J. Dugas, P. Durandeau: C.R. Acad. Sci. Paris 250, 3461–3463 (1960)
S. Bertram: Proc. Inst. Radio Eng. N.Y. 28, 418–420 (1940);
S. Bertram: J. Appl. Phys. 13, 496–502 (1942)
B. von Borries, F. Lenz, G. Opfer: Optik 10, 132–136 (1953)
H. Bremmer: Optik 10, 1–4 (1953)
L. Brillouin: C.R. Acad. Sci. Paris 183, 24–26 (1926)
K.A. Brookes, T. Mulvey, M.J. Wallington: Proc. 4th Eur. Reg. Conf. Electron Microscopy, Rome 1968, ed. by D.S. Bocciarelli ( Tipografia Poliglotta Vaticana, Rome 1968 ) Vol. I, pp. 165–166
H. Busch: Ann. Phys. (Leipzig) 81, 974–993 (1926)
V.E. Cosslett: J. Sci. Instrum. 17, 259–264 (1940)
J. Dosse: Z. Phys. 117, 316–321 (1941)
J. Dosse: Z. Phys. 117, 437–443, 722–753 (1941)
M. Duchesne: C.R. Acad. Sci. Paris 228, 1407–1408 (1949)
J. Dugas, P. Durandeau, Ch. Fert: Rev. Opt. Theor. Instrum. 40, 277–305 (1961)
J. Dugas, P. Durandeau, B. Fagot: Proc. 2nd Eur. Reg. Conf. Electron Microscopy, Delft, 1960, Vol. I, ed. by A.L. Houwink, B.J. Spit ( De Neederlandse Vereiniging voor Electronenmicroscopie, Delft 1960 ) pp. 35–40
P. Durandeau: J. Phys. Radium 16, 72S (1955)
P. Durandeau: Thesis, University of Toulouse; Ann. Fac. Sci. Univ. Toulouse Sci. Math. Sci. Phys. 21, 1–88 (1957)
P. Durandeau, B. Fagot, J. Barthère, M. Laudet: J. Phys. Radium 20a, 80A - 90A (1959)
P. Durandeau, Ch. Fert, P. Tardieu: C.R. Acad. Sci. Paris 246, 79–81 (1958)
A.B. El-Kareh, J.C.J. EI-Kareh: Electron Beams, Lenses and Optics (Academic, New York, London 1970 )
W. Glaser: Z. Phys. 117, 285–315 (1941)
W. Glaser, E. Lammel: Arch. Elektrotech. 37, 347–356 (1943)
W. Glaser: Ann. Phys. (Leipzig) 7, 213–227 (1950)
W. Glaser: Grundlagen der Elektronenoptik ( Springer, Wien 1952 )
W. Glaser, O. Bergmann: Z. Angew. Math. Phys. 1, 363–379 (1950);
W. Glaser, O. Bergmann: Z. Angew. Math. Phys. 2, 159–188 (1951)
W. Glaser, H. Grümm: Österr. Ing. Arch. 6, 360–372 (1952)
F. Gray: Bell Syst. Techn. J. 18, 1–31 (1939)
P. Grivet: C.R. Acad. Sci. Paris 233, 921–923 (1951);
P. Grivet: C.R. Acad. Sci. Paris 234, 73–75 (1952)
W.W. Hansen, D.L. Webster: Rev. Sci. Instrum. 7, 17–23 (1936)
M.B. Hesse: Proc. Phys. Soc. London B 63, 386–401 (1950)
O. Jandeleit, F. Lenz: Optik 16, 87–107 (1959)
H. Jeffreys: Proc. London Math. Soc. (2), 28, 81–90 (1928);
H. Jeffreys: Proc. London Math. Soc. 33, 246–252 (1932)
W. Kamminga, J.L. Verster, J.C. Francken: Optik 28, 442–461 (1968/1969)
H.A. Kramers: Z. Phys. 39, 828–840 (1926)
W. Kunath, W.D. Riecke, E. Ruska: Proc. 6th Int. Cong. Electron Microscopy, Kyoto, 1966, Vol. I, ed. by R. Uyeda (Maruzen, Tokyo 1966 ) pp. 139–140
G. Langner, F. Lenz: Optik 11, 171–180 (1954)
F. Lenz: Z. Angew. Phys. 2, 337–340 (1950)
F. Lenz: Optik 7, 243–253 (1950)
F. Lenz: Z. Angew. Phys. 2, 448–453 (1950)
F. Lenz: Ann. Phys. (Leipzig) 8, 124–128 (1950)
F. Lenz: Ann. Phys. (Leipzig) 9, 245–258 (1951)
F. Lenz: Optik 14, 72–82 (1957);
F. Lenz: Proc. 1st Eur. Reg. Conf. Electron. Microscopy, Stockholm, 1956, ed. by F.S. Sjöstrand, J. Rhodin ( Almqvist and Wiksell, Stockholm, 1957 ) pp. 48–51
G. Liebmann: Proc. Phys. Soc. London B62, 753–772 (1949)
G. Liebmann, E.M. Grad: Proc. Phys. Soc. London B64, 956–971 (1951)
G. Liebmann: Proc. Phys. Soc. London B64, 972–977 (1951)
G. Liebmann: Proc. Phys. Soc. London B65, 188–192 (1952)
G. Liebmann: Proc. Phys. Soc. London B68, 679–686 (1955)
G. Liebmann: Proc. Phys. Soc. London B68, 682–685 (1955)
G. Liebmann: Proc. Phys. Soc. London B68, 737–745 (1955)
M. van Ments, J.B. Le Poole: Appl. Sci. Res. B1, 3–17 (1947)
T. Mulvey: Proc. Phys. Soc. London B66, 441–447 (1953)
T. Mulvey, M.J. Wallington: Repts. Prog. Phys. 36, 347–421 (1973)
F. Ollendorff: Berechnung magnetischer Felder ( Springer, Wien 1952 )
W.D. Riecke, E. Ruska: Proc. 6th Int. Cong. Electron Microscopy, Kyoto, 1966, Vol. I, ed. by R. Uyeda (Maruzen, Tokyo 1966 ) pp. 19–20
E. Ruska: Arch. Elektrotech. 38, 102–130 (1944)
G. Wentzel: Z. Phys. 38, 518–529 (1926)
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1982 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Lenz, F. (1982). Properties of Electron Lenses. In: Hawkes, P.W. (eds) Magnetic Electron Lenses. Topics in Current Physics, vol 18. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-81516-4_3
Download citation
DOI: https://doi.org/10.1007/978-3-642-81516-4_3
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-81518-8
Online ISBN: 978-3-642-81516-4
eBook Packages: Springer Book Archive