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Recovery of Specimen Information for Strongly Scattering Objects

  • W. O. Saxton
Part of the Topics in Current Physics book series (TCPHY, volume 13)

Abstract

The previous chapter described the highly satisfactory theory of image formation and processing that results when the specimen is sufficiently thin and light to be treated in projection, and produces no more than slight attenuation and phase shifting of the incident electron beam. This limit is an increasingly close approximation as accelerating voltage and resolution increase; it is an approximation at best, however, and is sometimes simply untenable. Accordingly, this chapter is devoted to the much more difficult problem of image correction for stronger objects, when the imaging process is nonlinear. Although more laborious than the analyses applicable to weak objects, the methods reviewed here are still useful if applied to specimens which are too thick or heavy to be weak, but not too much so to be treated in projection still.

Keywords

Wave Function Image Intensity Blaschke Product Diffraction Plane Complex Zero 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1980

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  • W. O. Saxton

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