Abstract
The structure of AlAs/GaAs/AlAs quantum well interfaces grown with 100 s interruption at each of the interfaces is investigated. Cathodoluminescence (CL) peak energy histograms, wavelength images of the excitonic recombination and high-resolution transmission electron microscopy pictures yield partly identical and partly complementary atomic-scale information in the spatial frequency range from 1 mm−1 to 3 nm−1. Large smooth islands extending more than 2000 nm at the AlAs on GaAs interface are unambiguously observed by CL. TEM-pictures show interfaces without any steps within the whole area of observation being 150 nm, thus corroborating the CL results. In contrast to this the island extension at the GaAs on AlAs interface is 2–4 nm. All interfaces are found to be graded in growth direction due to cation exchange.
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Bimberg, D. et al. (1996). Atomically Abrupt Interfaces of Compound Semiconductor Heterostructures: The AlAs/GaAs Case. In: MacDonald, R.J., Taglauer, E.C., Wandelt, K.R. (eds) Surface Science. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-80281-2_21
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DOI: https://doi.org/10.1007/978-3-642-80281-2_21
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