Abstract
This paper provides a brief overview of recent electron microscopy studies of electron-stimulated desorption(ESD) processes occurring at maximally valent oxide surfaces, with emphasis upon the profile imaging mode of observation. The products that accumulate on the oxide surfaces as a result of ESD depend upon characteristics of the electron beam (energy, current density), the residual vacuum level, and the specimen temperature, and include reduced oxides, metallic particles and facetted exit-surface sputter pits. The diversity of results is an indication of competing electronic, diffusional and ballistic mechanisms: determination of the dominant process must be inferred from the final state of the surface under a variety of experimental conditions.
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© 1993 Springer-Verlag Berlin Heidelberg
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Smith, D.J., McCartney, M.R., Gajdardziska-Josifovska, M. (1993). Electron Microscopy of Electron-Stimulated Processes at Oxide Surfaces. In: Burns, A.R., Stechel, E.B., Jennison, D.R. (eds) Desorption Induced by Electronic Transitions DIET V. Springer Series in Surface Sciences, vol 31. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-78080-6_34
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DOI: https://doi.org/10.1007/978-3-642-78080-6_34
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