Abstract
YBCO/SrTiO3/YBCO thin film edge junctions were prepared in-situ and characterized. The epitaxial growth of SrTiO3 on YBCO led to a sharp and well defined junction edge with a very high yield. Typical junctions showed critical currents up to 83 K, with Ic ∝ (1 — T/Tc)2 temperature dependence. Sharp Shapiro steps were observed under microwave radiation at temperatures up to 82 K. A typical diffraction pattern was found in the voltage response of the junctions to transverse magnetic field.
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© 1992 Springer-Verlag Berlin Heidelberg
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Aharoni, E., Koren, G., Polturak, E., Cohen, D., Iskevitch, E. (1992). In-Situ YBa2Cu3O7/SrTiO3/YBa2Cu3O7 a-b Plane Josephson Edge Junctions. In: Koch, H., Lübbig, H. (eds) Superconducting Devices and Their Applications. Springer Proceedings in Physics, vol 64. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77457-7_5
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DOI: https://doi.org/10.1007/978-3-642-77457-7_5
Publisher Name: Springer, Berlin, Heidelberg
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