Barrier-Properties of All-Niobium Tunnel Junctions

  • G. M. Daalmans
  • O. Eibl
  • L. Bär
Part of the Springer Proceedings in Physics book series (SPPHY, volume 64)


The barrier-region of all-niobium tunnel junctions has been imaged by means of high resolution transmission electron microscopy (atomic scale). Amorphous silicon barriers as well as amorphous Al2O3-barriers have been studied. Different behaviour concerning wetting and roughness have been found. Finally the TEM-data are correlated with the transport properties of the barriers.


High Resolution Transmission Electron Microscopy Leakage Current Josephson Junction Tunnel Junction Ground Electrode 
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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • G. M. Daalmans
    • 1
  • O. Eibl
    • 2
  • L. Bär
  1. 1.Siemens Central Research LaboratoriesErlangenFed. Rep. of Germany
  2. 2.Siemens Central Research LaboratoriesMünchenFed. Rep. of Germany

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