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Percolation and Josephson Effects in High-Tc Polycrystalline Thin Films

  • Yu. Ya. Divin
  • V. N. Gubankov
Part of the Springer Proceedings in Physics book series (SPPHY, volume 64)

Abstract

The electrical properties and Josephson behaviour of high-Tc polycrystalline thin films are shown to be consistent with the model of a 2D array of intergrain Josephson junctions with an exponentially wide distribution of parameters. In these films the electrical currents flow through the critical subnetwork, with characteristic percolation length L being much larger than the grain size a. Single-Josephson-junction behavior is realized in polyciystalline high-Tc bridges with the dimensions w,l in the limits ξ< < a < w,l < L, and high responsive radiation detectors and Squid’s based on these bridges are demonstrated.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • Yu. Ya. Divin
    • 1
  • V. N. Gubankov
    • 1
  1. 1.Institute of Radioengineering & Electronics of the Academy of SciencesMoscowRussia

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