Skip to main content
SpringerLink
Log in

Glancing-Incidence X-Ray Analysis of Layered Materials

  • Conference paper
Surface X-Ray and Neutron Scattering

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 61))

Abstract

X rays at glancing incidence can set up an X-ray Standing Wave (XSW) in layered materials. In Glancing-Incidence X-ray Analysis (GIXA), the XSW is used as a nanometric yardstick to determine depth distributions of atoms by a combination of reflectivity and x-ray fluorescence. Examples are presented and features resulting from interface roughness are discussed.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. T.W. Barbee Jr. and W.K. Warburton, Mater. Lett. 3, 17 (1984).

    Article  Google Scholar 

  2. M.J. Bedzyk, G.M. Bommarito, and J.S. Schildkraut, Phys. Rev. Lett. 62, 1376 (1989).

    Article  ADS  Google Scholar 

  3. D.K.G. de Boer, Phys. Rev. B, in press.

    Google Scholar 

  4. D.K.G. de Boer and W.W. van den Hoogenhof, Adv. X-Ray Anal. 34, (1991), in press.

    Google Scholar 

  5. M.J. Bedzyk, D.H. Bilderback, G.M. Bommarito, M. Caffrey and J.S. Schildkraut, Science 241, 1788 (1988).

    Article  ADS  Google Scholar 

  6. D.K.G. de Boer and W.W. van den Hoogenhof, Spectrochim. Acta B, in press.

    Google Scholar 

  7. Proc. 2d TXRF Workshop, Dortmund 1988, Spectrochim. Acta 44B, No. 5 (1989).

    Google Scholar 

  8. Proc. 3d TXRF Workshop, Vienna 1990, Spectrochim. Acta, in press.

    Google Scholar 

  9. D.K.G. de Boer, Spectrochim. Acta B, in press.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Philips Research Laboratories, P.O. Box 80000, 5600 JA, Eindhoven, The Netherlands

    D. K. G. de Boer

  2. Philips Analytical, Lelyweg 1, 7602 EA, Almelo, The Netherlands

    W. W. van den Hoogenhof

Authors
  1. D. K. G. de Boer
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. W. W. van den Hoogenhof
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. Fakultät für Physik und Astronomie, Ruhr-Universität Bochum, W-4630, Bochum, Fed. Rep. of Germany

    Hartmut Zabel

  2. AT&T Bell Laboratories, Brookhaven National Laboratory, Building 510E, Upton, NY, 11973, USA

    Ian K. Robinson

Rights and permissions

Reprints and permissions

Copyright information

© 1992 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

de Boer, D.K.G., van den Hoogenhof, W.W. (1992). Glancing-Incidence X-Ray Analysis of Layered Materials. In: Zabel, H., Robinson, I.K. (eds) Surface X-Ray and Neutron Scattering. Springer Proceedings in Physics, vol 61. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-77144-6_22

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-77144-6_22

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-77146-0

  • Online ISBN: 978-3-642-77144-6

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Search

Navigation