Anomalous Reflectivity: A New Method for Determining Density Profiles of Thin Films
We present a method of obtaining a model-independent density profile for a thin film deposited on a substrate using reflectivity measurements carried out at energies close to, and away from, a convenient absorption edge of the substrate. We illustrate the method using simulated data from various model profiles and with a synchrotron X-ray experiment carried out on a polymer film deposited on a Germanium substrate.
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