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Anomalous Reflectivity: A New Method for Determining Density Profiles of Thin Films

  • S. K. Sinha
  • M. K. Sanyal
  • K. G. Huang
  • A. Gibaud
  • M. Rafailovich
  • J. Sokolov
  • X. Zhao
  • W. Zhao
Part of the Springer Proceedings in Physics book series (SPPHY, volume 61)

Abstract

We present a method of obtaining a model-independent density profile for a thin film deposited on a substrate using reflectivity measurements carried out at energies close to, and away from, a convenient absorption edge of the substrate. We illustrate the method using simulated data from various model profiles and with a synchrotron X-ray experiment carried out on a polymer film deposited on a Germanium substrate.

Keywords

Density Profile Reflectivity Measurement Reflectivity Profile Electron Density Profile Uniform Film 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. [1]
    L. G. Parratt, Phys. Rev. 95, 359 (1954).ADSCrossRefGoogle Scholar
  2. [2]
    J. Als-Nielsen, NATO ASI Ser. B176, 639 (1988).CrossRefGoogle Scholar
  3. P. S. Pershan, General Discussion 89, Royal Society of Chemistry, Faraday Division (1990).Google Scholar
  4. [3]
    G. P. Felcher, private communication.Google Scholar
  5. C. F. Majkrzak, private communication.Google Scholar
  6. [4]
    A. Messiah, Quantum Mechanics (Wiley, New York, 1962), Vol. 2, p. 673.MATHGoogle Scholar
  7. [5]
    S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B38, 2297 (1988).ADSCrossRefGoogle Scholar
  8. [6]
    X. Zhao, W. Zhao, J. Sokolov, M. Rafailovich, S. A. Schwarz, and B. J. Wilkens, to be published.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • S. K. Sinha
    • 1
  • M. K. Sanyal
    • 1
  • K. G. Huang
    • 1
  • A. Gibaud
    • 2
  • M. Rafailovich
    • 3
  • J. Sokolov
    • 3
  • X. Zhao
    • 3
  • W. Zhao
    • 3
  1. 1.Physics DepartmentBrookhaven National LaboratoryUptonUSA
  2. 2.University of MaineC.N.R.S.Le MansFrance
  3. 3.Physics DepartmentQueens CollegeUSA

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