Anomalous Reflectivity: A New Method for Determining Density Profiles of Thin Films
We present a method of obtaining a model-independent density profile for a thin film deposited on a substrate using reflectivity measurements carried out at energies close to, and away from, a convenient absorption edge of the substrate. We illustrate the method using simulated data from various model profiles and with a synchrotron X-ray experiment carried out on a polymer film deposited on a Germanium substrate.
KeywordsDensity Profile Reflectivity Measurement Reflectivity Profile Electron Density Profile Uniform Film
Unable to display preview. Download preview PDF.
- P. S. Pershan, General Discussion 89, Royal Society of Chemistry, Faraday Division (1990).Google Scholar
- G. P. Felcher, private communication.Google Scholar
- C. F. Majkrzak, private communication.Google Scholar
- X. Zhao, W. Zhao, J. Sokolov, M. Rafailovich, S. A. Schwarz, and B. J. Wilkens, to be published.Google Scholar