Abstract
We have measured the intensity of the elastic reflection of electrons impinging on Cu(001) as a function of the polar angle of emergence along the [010] azimuth and of the energy of the electrons in the range of 200 to 1500 eV. We have found that the forward focusing effect, which occurs in Auger electron diffraction (AED) and x-ray photoelectron diffraction (XPD) /1–3/, is the dominant effect at electron energies greater than 500 eV. The importance of this finding is that both the reciprocal and the real lattices can be explored in the same experiment by simply varying the energy of the electrons.
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© 1992 Springer-Verlag Berlin Heidelberg
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Ascolani, H., Guraya, M.M., Zampieri, G. (1992). Forward Focusing Effect in the Elastic Scattering of Electrons from Cu(001). In: Ponce, F.A., Cardona, M. (eds) Surface Science. Springer Proceedings in Physics, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-76376-2_21
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DOI: https://doi.org/10.1007/978-3-642-76376-2_21
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