Abstract
Electron microscopes were developed to obtain high resolution images of very small subcellular objects, and have given plant pathologists enormous amounts of information concerning parasites and host-parasite interactions. Electron microscopes are of great value in plant pathology, as this book illustrates, and it is difficult to envision doing either applied or fundamental pathology research without them. Moreover, electron microscopes yield more than detailed morphological and cytological information, because interaction of beam electrons with specimens creates numerous signals useful in detecting and identifying chemical elements in specimens. When electron microscopes are fitted with instrumentation to detect these various signals they become versatile and powerful analytical instruments, adding greatly to the overall goal in plant pathology of relating in situ structure(s) and function(s), or dysfunction(s).
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© 1991 Springer-Verlag Berlin Heidelberg
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Zeyen, R.J. (1991). Analytical Electron Microscopy in Plant Pathology: X-Ray Microanalysis and Energy Loss Spectroscopy. In: Mendgen, K., Lesemann, DE. (eds) Electron Microscopy of Plant Pathogens. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75818-8_5
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DOI: https://doi.org/10.1007/978-3-642-75818-8_5
Publisher Name: Springer, Berlin, Heidelberg
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