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Electron Microscopy of Plant Pathogens pp 17–29Cite as

Low-Temperature Scanning Electron Microscopy of Fungi and Fungus-Plant Interactions

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Abstract

Low-temperature scanning electron microscopy (LTSEM) involves direct examination of frozen-hydrated material at low temperature in the scanning electron microscope (SEM). Biological specimens prepared and examined in this way typically exhibit superior preservation over those prepared by procedures which necessitate examination of dried material at ambient temperature. This is because frozen-hydrated specimens: (a) are rapidly immobilized and stabilized by cryofix-ation; (b) retain most or all of their water; and (c) are not exposed to chemicals, fixatives or solvents. Other advantages of LTSEM include ease and speed of preparation and versatility with regard to the range of ways in which a single frozen specimen can be manipulated [6]. Although Echlin and coworkers published the Jirst detailed study involving LTSEM of biological material in 1970 [10], LTSEM did not become routine in many laboratories around the world until the 1980’s when various commercial cryopreparation systems became available [6, 20, 27, 29].

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Author information

Authors and Affiliations

  1. Institute of Cell and Molecular Biology, University of Edinburgh, King’s Buildings, Mayfield Road, Edinburgh, EH9 3JH, Scotland, UK

    Nick D. Read

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  1. Nick D. Read
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Editors and Affiliations

  1. Fakultät für Biologie, Lehrstuhl Phytopathologie, Universität Konstanz, D-7750, Konstanz, Germany

    Kurt Mendgen

  2. Biologische Bundesanstalt für Land- und Forstwirtschaft, Institut für Viruskrankheiten der Planzen, Messeweg 11/12, D-3300, Braunschweig, Germany

    Dietrich-Eckhardt Lesemann

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© 1991 Springer-Verlag Berlin Heidelberg

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Read, N.D. (1991). Low-Temperature Scanning Electron Microscopy of Fungi and Fungus-Plant Interactions. In: Mendgen, K., Lesemann, DE. (eds) Electron Microscopy of Plant Pathogens. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75818-8_2

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  • DOI: https://doi.org/10.1007/978-3-642-75818-8_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-75820-1

  • Online ISBN: 978-3-642-75818-8

  • eBook Packages: Springer Book Archive

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