Abstract
Low energy (< 10 keV) ion scattering spectrometry [10.1] is becoming increasingly important as a surface analysis technique in three specific areas, i.e., surface elemental analysis [10.2–4], probing surface structure [10.5–16], and studying electronic transition probabilities [10.7,7–19] between ions or atoms and surfaces. This is largely due to the following recent advances: (i) impact collision ion scattering spectrometry [10.6] (ICISS) in which the scattering angle is close to 180°, thus simplifying the scattering geometry and allowing experimental determination of the shadow cone radii, (ii) the use of alkali primary ions [10.9, 10] which have low neutralization probabilities, leading to higher scattered ion fluxes, (iii) time-of-flight (TOF) techniques [10.20–23] with detection of both neutrals and ions in a multichannel mode in order to enhance sensitivity, (iv) scattered ion fractions [10.7,17] to probe the spatial distributions of electrons, and (v) the use of recoiling [10.24, 25] to determine the structure of light adsorbates on surfaces.
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Grizzi, O., Shi, M., Bu, H., Rabalais, J.W. (1990). Time-of-Flight Scattering and Recoiling Spectrometry (TOF-SARS) for Surface Analysis. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces VIII. Springer Series in Surface Sciences, vol 22. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75762-4_10
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