Surface X-Ray Diffraction: The Atomic Geometry of the Ge(111)7×7-Sn and Ge(111)5×5-Sn Reconstructions

  • J. Skov Pedersen
  • R. Feidenhans’l
  • M. Nielsen
  • K. Kjær
  • F. Grey
  • R. L. Johnson
  • C. Reiss
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 11)

Abstract

The Ge(111) surface exhibits 7×7 and 5×5 reconstructions after deposition of submonolayer coverages of Sn and subsequent annealing. We have examined these structures by surface x-ray diffraction and collected 90 non-equivalent fractional-order reflections for the 7×7 structure, and 115 for the 5×5. The diffraction pattern for both structures show considerable similarity with the pattern for Si(111)7×7, and it is shown that the DAS (Dimer Adatom Stacking fault) model for Si(111)7×7 is also applicable to the Sn-induced Ge(111)7×7 and 5×5 structures. Furthermore, we have identified the adatoms to be Sn. For the 5×5 structure a partial substitution of Ge with Sn was found at the dimer positions closest to the corner vacancies.

Keywords

Peri 

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Copyright information

© Springer-Verlag Berlin Heidelberg 1988

Authors and Affiliations

  • J. Skov Pedersen
    • 1
  • R. Feidenhans’l
    • 1
  • M. Nielsen
    • 1
  • K. Kjær
    • 1
  • F. Grey
    • 2
  • R. L. Johnson
    • 2
  • C. Reiss
    • 3
  1. 1.Risø National LaboratoryRoskildeDenmark
  2. 2.Max-Planck-Institute for Solid State ResearchStuttgart 80Fed. Rep. of Germany
  3. 3.Laboratory of Crystallography, J.H. van’t Hoff InstituteAmsterdam UniversityAmsterdamThe Netherlands

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