Surface X-Ray Diffraction: the Ge(00l)2×1 Reconstruction and Surface Relaxation

  • F. Grey
  • R. L. Johnson
  • J. Skov Pedersen
  • R. Feidenhans’l
  • M. Nielsen
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 11)


The (001) surfaces of Si and Ge exhibit a two domain 2×l reconstruction. Despite the variety of experiments performed on both these surfaces, the detailed atomic geometry of the 2×l unit cell is not known. Of the many models proposed, a dimer model is supported by many experiments, including STM /1/, LEED /2/, and ion scattering /3/. In a pioneering experiment, EISENBERGER and MARRA /4/ measured five Bragg reflections from the Ge(OOl) 2×l surface by synchrotron x-ray diffraction. The data set is too small to perform detailed crystallographic analysis, but it supports a dimer model and suggests second layer motion.


Dime Model Total External Reflection Patterson Function Atomic Geometry Layer Relaxation 
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Copyright information

© Springer-Verlag Berlin Heidelberg 1988

Authors and Affiliations

  • F. Grey
    • 1
  • R. L. Johnson
    • 1
  • J. Skov Pedersen
    • 2
  • R. Feidenhans’l
    • 2
  • M. Nielsen
    • 2
  1. 1.Max-Planck-Institute for Solid State ResearchStuttgart 80Fed. Rep. of Germany
  2. 2.Risø National LaboratoryRoskildeDenmark

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