Surface X-Ray Diffraction: the Ge(00l)2×1 Reconstruction and Surface Relaxation
The (001) surfaces of Si and Ge exhibit a two domain 2×l reconstruction. Despite the variety of experiments performed on both these surfaces, the detailed atomic geometry of the 2×l unit cell is not known. Of the many models proposed, a dimer model is supported by many experiments, including STM /1/, LEED /2/, and ion scattering /3/. In a pioneering experiment, EISENBERGER and MARRA /4/ measured five Bragg reflections from the Ge(OOl) 2×l surface by synchrotron x-ray diffraction. The data set is too small to perform detailed crystallographic analysis, but it supports a dimer model and suggests second layer motion.
KeywordsDime Model Total External Reflection Patterson Function Atomic Geometry Layer Relaxation
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