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Resolution in Scanning Tunneling Microscopy

  • J. Tersoff
Conference paper
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 11)

Abstract

In any microscopy, it is extremely useful to know the resolution (or more precisely the resolution function) of the instrument. Here the present understanding of the resolution of Scanning Tunneling Microscopy (STM) is reviewed.

Keywords

Scan Tunneling Microscopy Resolution Function Tunneling Current Scan Tunneling Microscopy Image Large Tunneling 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1988

Authors and Affiliations

  • J. Tersoff
    • 1
  1. 1.IBM Thomas J. Watson Research CenterYorktown HeightsUSA

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