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A Technique for Wing Suppressed IR Sampling

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Picosecond Electronics and Optoelectronics II

Part of the book series: Springer Series in Electronics and Photonics ((SSEP,volume 24))

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Abstract

The development of hot electron techniques and high mobility materials is one more step bringing electronics to the 100 GHz regime. With these new approaches come the problems of measuring device characteristics and performance. Several approaches have now been developed to observe high-speed electrical transients using the electro-optic technique [1]. In the case of many III–V compound semiconductors such as GaAs and InP, direct probing of the semiconductor substrate is possible. Such probing is potentially very useful as it allows for the noncontact noninvasive probing of devices and circuits. Noncontact measurements of devices and circuits have been made using compressed pulses from a cw mode-locked Nd:YAG laser [2]. This paper deals specifically with the use of compressed pulses for directly probing device and circuit substrates.

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References

  1. J.A. Valdmanis and G.A. Mourou, Laser Focus, 84–96 (February 1986) and Laser Focus. 96–106 (March 1986).

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  2. B.H. Kolner and D.M. Bloom, IEEE J. Quant. Elec. QE-22. 79–93 (1986).

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  3. D. Grischkowsky and A.C. Balout, Appl. Phys. Lett. 41(1). 1–3, (1982).

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  4. J.A. Valdmanis, G.A. Mourou, and C.W. Gabel, Appl. Phys. Lett. QE-19, 664–667 (1982).

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Author information

Authors and Affiliations

  1. Laboratory for Laser Energetics, University of Rochester, 250 East River Road, Rochester, NY, 14623, USA

    J. Nees & S. Williamson

Authors
  1. J. Nees
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  2. S. Williamson
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Editor information

Editors and Affiliations

  1. United Technologies Research Center, 06108, East Hartford, CT, USA

    Frederick John Leonberger

  2. Dept. of Electrical Engineering, University of Maryland, 20742, College Park, MD, USA

    Chi H. Lee

  3. AT&T Bell Laboratories, Room 7A-209, 600 Mountain Avenue, 07974, Murray Hill, NJ, USA

    Federico Capasso

  4. Dept. of Electrical Engineering, University of Illinois, 61801, Champaign Urbana, IL, USA

    Hadis Morkoc

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© 1987 Springer-Verlag Berlin Heidelberg

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Nees, J., Williamson, S. (1987). A Technique for Wing Suppressed IR Sampling. In: Leonberger, F.J., Lee, C.H., Capasso, F., Morkoc, H. (eds) Picosecond Electronics and Optoelectronics II. Springer Series in Electronics and Photonics, vol 24. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72970-6_7

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  • DOI: https://doi.org/10.1007/978-3-642-72970-6_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-72972-0

  • Online ISBN: 978-3-642-72970-6

  • eBook Packages: Springer Book Archive

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