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Quantum Transport Calculation of Resonant-Tunneling Response Time

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Book cover Picosecond Electronics and Optoelectronics II

Part of the book series: Springer Series in Electronics and Photonics ((SSEP,volume 24))

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Abstract

The progress of semiconductor fabrication technology, particularly the hetero-epitaxial technology, has permitted the fabrication of devices whose behavior is dominated by quantum-interference effects. The most widely studied example of a quantum size-effect device is the resonant tunneling diode (RTD) [1,2]. This device exhibits interesting properties in the form of a negative-resistance region of its characteristic curve, and there are indications that its response time might be very short [2]. In the present work the RTD was taken as a prototype quantum device for the development of techniques for the analysis of such devices.

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References

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Author information

Authors and Affiliations

  1. Texas Instruments Incorporated, P.O. Box 655936, M.S. 154, Dallas, TX, 75265, USA

    W. R. Frensley

Authors
  1. W. R. Frensley
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Editor information

Editors and Affiliations

  1. United Technologies Research Center, 06108, East Hartford, CT, USA

    Frederick John Leonberger

  2. Dept. of Electrical Engineering, University of Maryland, 20742, College Park, MD, USA

    Chi H. Lee

  3. AT&T Bell Laboratories, Room 7A-209, 600 Mountain Avenue, 07974, Murray Hill, NJ, USA

    Federico Capasso

  4. Dept. of Electrical Engineering, University of Illinois, 61801, Champaign Urbana, IL, USA

    Hadis Morkoc

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© 1987 Springer-Verlag Berlin Heidelberg

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Frensley, W.R. (1987). Quantum Transport Calculation of Resonant-Tunneling Response Time. In: Leonberger, F.J., Lee, C.H., Capasso, F., Morkoc, H. (eds) Picosecond Electronics and Optoelectronics II. Springer Series in Electronics and Photonics, vol 24. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72970-6_23

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  • DOI: https://doi.org/10.1007/978-3-642-72970-6_23

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-72972-0

  • Online ISBN: 978-3-642-72970-6

  • eBook Packages: Springer Book Archive

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