Diffraction-Imaging Possibilities with Soft X-rays

Abstract

Diffraction imaging is a form of microscopy which does not quite exist as yet with soft x-rays, but on which work is proceeding. It has, however, a long history with x-rays in the 0.1nm wavelength region (x-ray diffraction analysis), with electrons (electron diffraction), and in visible-light holography. Its interest lies in its being potentially the highest-resolution form of x-ray microscopy (see the previous article by the author in this volume), and in its special ability to obtain information regarding 3-dimensional structure in a single exposure. The present paper outlines the general principles of the method and gives a brief summary of its current status.