Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection

  • Denis Joyeux
  • François Polack


After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness.

More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given.


Fringe Pattern Photographic Record Carbon Foil Interferometric Technique Fringe Shift 
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Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • Denis Joyeux
    • 1
  • François Polack
    • 2
  1. 1.Institut d’Optique Théorique et Appliquée (IOTA)Orsay cedexFrance
  2. 2.Laboratoire pour l’Utilisation du Rayonnement Synchrotron (LURE)Orsay cedexFrance

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