Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection
After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness.
More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given.
KeywordsFringe Pattern Photographic Record Carbon Foil Interferometric Technique Fringe Shift
Unable to display preview. Download preview PDF.
- 1.D. Joyeux, P. Jaeglé, and A. L’Huillier, in Trends in Optics, vol 3 (Academic Press, 1996).Google Scholar
- 2.See for instance: X-Ray microscopy II, eds D. Sayre, M. Howells, J. Kirz and H. Rarback, (Springer, Berlin, 1988).Google Scholar
- 6.F. Polack and D. Joyeux, in X-ray Microscopy III, A. G. Michette, G. R. Morrison, and C. L. Buckley eds. (Springer series in optical science vol’ 67, Springer, 1992).Google Scholar
- 12.J. Svatos, Ph. D. thesis, (Univ. Paris XI, Orsay, France, 1994).Google Scholar
- 13.F. Polack, D. Joyeux, X-ray Microscopy IV, edited by A. I. Erko and V. V. Aristov, (Bogorodski Pechatnik, Chemogolovka, Moscow, 1994).Google Scholar
- 14.F. Polack and D. Joyeux, “Phase contrast experiments on the NSLS-XIA scanning microscope”, this conference.Google Scholar
- 15.U. Bonse, F. Beckmann, F. Busch, and O. Günnewig “X-ray microtomography using interferometric phase contrast”, this conference.Google Scholar