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Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection

  • Denis Joyeux
  • François Polack

Abstract

After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness.

More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given.

Keywords

Fringe Pattern Photographic Record Carbon Foil Interferometric Technique Fringe Shift 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • Denis Joyeux
    • 1
  • François Polack
    • 2
  1. 1.Institut d’Optique Théorique et Appliquée (IOTA)Orsay cedexFrance
  2. 2.Laboratoire pour l’Utilisation du Rayonnement Synchrotron (LURE)Orsay cedexFrance

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