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Intraoperative Monitoring of Evoked Potentials for Surgery in and around the Third Ventricle and the Brain Stem

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Surgery in and around the Brain Stem and the Third Ventricle

Abstract

Monitoring central nervous system function intraoperatively using evoked potentials is applied with the hope that impairment of afferent function is noted before the damage to nervous structures has become irreversible, thus giving the surgeon a chance to change his mode of working. Flash-evoked visual potentials (VEP) and acoustic evoked brain stem potentials (BAEP) have been used to monitor the acoustic pathway in the brain stem and the visual pathway encircling the hypothalamus. (Ojeman et al. 1984; Grundy et al. 1982; Raudzens 1982; Allen et al. 1981; Feinsod et al. 1976).

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References

  • Allen A, Starr A, Nudleman K (1981) Assessment of sensory function in the operating room utilizing cerebral evoked potentials: A study of fifty-six surgically anesthetized patients. Clin Neurosurg 28: 457–481

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© 1986 Springer-Verlag Berlin Heidelberg

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Schramm, J., Cedzich, C., Fahlbusch, R., Mokrusch, T., Hochstetter, H. (1986). Intraoperative Monitoring of Evoked Potentials for Surgery in and around the Third Ventricle and the Brain Stem. In: Samii, M. (eds) Surgery in and around the Brain Stem and the Third Ventricle. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-71240-1_15

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  • DOI: https://doi.org/10.1007/978-3-642-71240-1_15

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-71242-5

  • Online ISBN: 978-3-642-71240-1

  • eBook Packages: Springer Book Archive

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