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Surface Analytical and Capacitance-Voltage Characterization of Anodic Oxide Films on Hg0.8Cd0.2Te

  • H. J. Richter
  • U. Solzbach
  • M. Seelmann-Eggebert
  • H. Brendecke
  • H. Maier
  • J. Ziegler
  • R. Krüger
Conference paper
Part of the Springer Series in Electrophysics book series (SSEP, volume 7)

Abstract

Surface passivation is an essential technological process for the production of IR quantum detectors. In the case of n-type Hg0.8Cd0.2Te an anodic oxide proved to be an adequate passivant. However, the chemical and physical properties of the anodic oxide are still subject to discussion.

Keywords

Anodic Oxide Anodic Film Anodic Oxide Film Depth Profile Analysis Characteristic Chemical Shift 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1981

Authors and Affiliations

  • H. J. Richter
    • 1
  • U. Solzbach
    • 1
  • M. Seelmann-Eggebert
    • 1
  • H. Brendecke
    • 2
  • H. Maier
    • 2
  • J. Ziegler
    • 2
  • R. Krüger
    • 2
  1. 1.Fraunhofer-Institut für Angewandte FestkörperphysikFreiburgFed. Rep. of Germany
  2. 2.Geschäftsbereich HalbleiterAEG-Telefunken Serienprodukte AGHeilbronnFed. Rep. of Germany

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