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Reparable and Irreparable Damage in Yeast Cells after Low LET-Irradiation

  • D. Frankenberg
Conference paper
Part of the Proceedings in Life Sciences book series (LIFE SCIENCES)

Abstract

Diploid yeast cells in early Gl phase were irradiated with 60Co-γ-rays or 30 MeV electrons (mean LET, L̄ =0.2 keV/µm) and with x-rays (effective photon energy = 40 keV; L̄ = 3 keV/µm). The dose rates of the irradiation were so low (Ḋ = 27 rad/min) that maximum repair occurred during irradiation.

60Co-γ-rays produce no irreparable damage up to absorbed doses D of about 120 krads. X-rays on the other hand cause irreparable damage in the same dose range, yielding a survival fraction of 0.25 at D = 120 krads.

Comparing the cumulative fractional absorbed dose distributions in L100 for 60Co-γ-rays and for x-rays (Eeff = 40 keV), the irreparable damage due to x-irradiation cannot be caused by the high LET fraction of the absorbed dose (L ≥ 10 keV/µm). In fact, the x-ray-induced irreparable damage is caused by the fraction of the absorbed dose in the LET range from about 1 keV/µm to 10 keV/µm.

Keywords

Dose Rate Linear Energy Transfer High Dose Rate Absorb Dose Rate Irreparable Damage 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. International Commission on Radiation Units and Measurements: Linear Energy Transfer, ICRU Report 16, p. 12, Washington, 1970Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1976

Authors and Affiliations

  • D. Frankenberg

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