Abstract
Extremely high electron accelerating voltages have been tried in the past in attempts to see internal detail in biological specimens up to 1 µ thick. In addition there is a slight theoretical gain in resolution as the voltage is raised. These two reasons have led to instruments for 220 kV, (1), 300 kV, (2), 400 kV, (3) and 1400 kV (4) among others. The advent of the ultra-microtome in various forms, capable of cutting sections 0.01 µ thick, has eliminated the need for penetration. The improvement in resolution has never been demonstrated since the contrast falls more rapidly as the voltage is raised. At present there is a need to follow the converse of past work and investigate the region below 10 kV for electron microscopy. The resolving power of the instrument will deteriorate only slightly while the gain in contrast may actually improve the overall resolution for a given thin section.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Müller, H. O., and E. Ruska: Kolloid-Z. 95, 21 (1941).
Zworykin, V. K., J. Hillier, and A. W. Vance: J. appl. Physics 12, 738 (1941).
Dorsten, A. C. van, W. J. Oosterkamp, and J. B. Le Poole: Philips techn. Rev. 9, 193 (1947).
Marton, L.: Electron Mic. Conference, Cambridge 1948, quoted in (5), 269.
Cosslett, V. E.: Practical Electron Microscopy, p. 104. London: Butterworths 1951.
Cosslett, V. E.: Proc. Phys. Soc. 58, 443 (1946).
Knoll, M.: Electron Physics Conference, Washington, 1951, Nat. Bur. Stands. Circ. 527, 329 (1954).
Cosslett, V. E.: Les Techniques Récentes en Microscopie Electronique. C.N.R.S., Toulouse Conf., p. 44, 1955.
Hall, C. E.: Introduction to Electron Microscopy, p. 301. New York: McGraw-Hill 1953.
Haine, M. E.: Intensification of the Electron Microscope Image. J. Phot. Sci. 1958 (in the press).
Feldman, C., and M. O’Hara: J. opt. Soc. Amer. 47, 300 (1957).
Pattee, H. H.: Science 128, 977 (1958).
Valentine, R. C.: Nature (Lond.) 181, 832 (1958).
Oberlin, A., and C. Tchoubar: Programme of this Conference, Abstract 15.06 (no lecture).
Drechsler, M., V. E. Cosslett, and W. C. Nixon: This vol. p. 13.
Valentine, R. C.: Private Communication 1958.
Siegel, B. M., and K. C. Knowlton: X-ray microscopy and microradiography Proc. Cambridge Symposium 1956. Academic Press N. Y. p. 108 (1957).
Author information
Authors and Affiliations
Editor information
Rights and permissions
Copyright information
© 1960 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Nixon, W.C. (1960). Low voltage electron microscopy. In: Möllenstedt, G., Niehrs, H., Ruska, E. (eds) Physikalisch-Technischer Teil. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-50195-1_95
Download citation
DOI: https://doi.org/10.1007/978-3-642-50195-1_95
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-50196-8
Online ISBN: 978-3-642-50195-1
eBook Packages: Springer Book Archive