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EXAFS and Near Edge Structure pp 22–28Cite as

Role of Inelastic Effects in EXAFS

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Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 27))

Abstract

The validity of the modern short-range-order theory of EXAFS (extended x-ray absorption fine structure) is largely a result of inelastic processes which give an energetic photoelectron a short mean free path. The need for including inelastic damping effects in calculations of EXAFS spectra x(k) is graphically illustrated by a comparison of typical results [1] of one-electron theory and experiment [2] (Fig.1).

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References

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Author information

Authors and Affiliations

  1. Department of Physics, University of Washington, Seattle, WA, 98195, USA

    J. J. Rehr & S.-H. Chou

Authors
  1. J. J. Rehr
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  2. S.-H. Chou
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Editor information

Editors and Affiliations

  1. Dipartimento di Fisica, Università di Roma, La Sapienza, P. Aldo Moro 2, I-00185, Roma, Italy

    Antonio Bianconi

  2. Laboratori Nazionali di Frascati, PULS-CNR, P.O. Box 13, I-00044, Frascati, Italy

    Lucia Incoccia

  3. Laboratori Nazionali di Frascati, INFN, P.O. Box 13, I-00044, Frascati, Italy

    Stanislao Stipcich

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© 1983 Springer-Verlag Berlin Heidelberg

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Rehr, J.J., Chou, SH. (1983). Role of Inelastic Effects in EXAFS. In: Bianconi, A., Incoccia, L., Stipcich, S. (eds) EXAFS and Near Edge Structure. Springer Series in Chemical Physics, vol 27. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-50098-5_4

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  • DOI: https://doi.org/10.1007/978-3-642-50098-5_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-50100-5

  • Online ISBN: 978-3-642-50098-5

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