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Role of Inelastic Effects in EXAFS

  • J. J. Rehr
  • S.-H. Chou
Conference paper
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 27)

Abstract

The validity of the modern short-range-order theory of EXAFS (extended x-ray absorption fine structure) is largely a result of inelastic processes which give an energetic photoelectron a short mean free path. The need for including inelastic damping effects in calculations of EXAFS spectra x(k) is graphically illustrated by a comparison of typical results [1] of one-electron theory and experiment [2] (Fig.1).

Keywords

EXAFS Spectrum Core Hole Inelastic Effect Imaginary Potential Coulomb Hole 
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References

  1. 1.
    S.H. Chou: Ph.D. Thesis, University of Washington (1982); S.H. Chou and J. J. Rehr (unpublished)Google Scholar
  2. 2.
    E.A. Stern, S.M. Heald, B. Bunker: Phys. Rev. Lett. 42, 1372 (1979), and private communicationADSCrossRefGoogle Scholar
  3. 3.
    K.H. Johnson: Adv. Quantum Chem. 7, 143 (1973)ADSCrossRefGoogle Scholar
  4. 4.
    J.J. Rehr, E.A. Stern, R.L. Martin, E.R. Davidson: Phys. Rev. B 17, 560 (1978)ADSCrossRefGoogle Scholar
  5. 5.
    P.A. Lee, G. Beni: Phys. Rev. B 15, 2862 (1977)ADSCrossRefGoogle Scholar
  6. 6.
    R.L. Martin, E.R. Davidson: Phys. Rev. A 16, 1341 (1977)ADSCrossRefGoogle Scholar
  7. 7.
    P. Nozieres, C.T. de Dominicis: Phys. Rev. 178, 1097 (1969)ADSCrossRefGoogle Scholar
  8. 8.
    E.A. Stern (unpublished)Google Scholar
  9. 9.
    P.A.M. Dirac: Proc. Cambridge Philos. Soc. 26, 376 (1930)ADSMATHCrossRefGoogle Scholar
  10. 10.
    L. Hedin, S. Lundquist: Solid State Phys. 23, 1 (1969)CrossRefGoogle Scholar
  11. 11.
    L.J. Sham, W. Kohn: Phys. Rev. 145, 561 (1966)ADSCrossRefGoogle Scholar
  12. 12.
    B.K. Teo, P.A. Lee: J. Am. Chem. Soc. 101, 2815 (1979)CrossRefGoogle Scholar
  13. 13.
    D.B. Tran Thoai, W. Ekardt: Solid St. Commun. 40, 269 (1981)ADSCrossRefGoogle Scholar
  14. 14.
    B.M. Kincaid, P. Eisenberger: Phys. Rev. Lett. 34, 1361 (1976)ADSCrossRefGoogle Scholar
  15. P.H. Citrin, P. Eisenberger, B.M. Kincaid: Phys. Rev. Lett. 36, 1346 (1976)ADSCrossRefGoogle Scholar
  16. 15.
    See in this connection R.F. Pettifer: Proc. 4th EPS Gen. Conf. (1979), p. 522, and this volumeGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1983

Authors and Affiliations

  • J. J. Rehr
    • 1
  • S.-H. Chou
    • 1
  1. 1.Department of PhysicsUniversity of WashingtonSeattleUSA

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