Summary
This paper deals with sequential sampling plans for attributive inspection. With a more general definition any kind of sequential sampling plans are included, especially all curtailed single, double and multiple sampling plans as well as all truncated and non-truncated SPRT’s (sequential probability ratio tests). In a natural way (by direct methods) we find a recursive formula to compute the termination probabilites for acceptance and rejection of the whole lot. Exact computer algorithms are given in a pseudo-programming language to calculate these probabilities in both cases, sampling with and without replacement. Then there is no difficulty to exactly compute the characteristics of any sequential sampling plan like operating characteristic, power function, average sample number or costs, average outgoing quality, average total inspection and so on.
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References
Aroian, L.A. (1976): Applications of the direct method in sequential analysis, in: Technometrics18, 301–306.
Hill, I.D. (1970): Algorithm AS 31: Operating characteristic and average sample size for binomial sequential sampling, in: Applied Statistics19, 197–203.
McPherson, K. (1974): Algorithm AS 67: The evaluation of absorption probabilities in sequential binomial sampling, in: Applied Statistics23, 83–86.
Rinne, H. Mittag, H.-J. (1989): Statistische Methoden der Qualitätssicherung, Hanser: München.
Schilling, E.G.(1982): Acceptance Sampling in Quality Control, Marcel Dekker: New York.
Wald, A.(1947): Sequential Analysis, Wiley: New York.
Würländer, R. (1990): Sequentielle Prüfplane für die Attributenkontrolle: Exakte Berechnung ihrer Charakteristika, Research report: Department of Statistics, University of Munich (to appear in German).
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© 1990 Physica-Verlag Heidelberg
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Würländer, R. (1990). Characteristics of Sequential Sampling Plans for Attributes: Algorithms for Exact Computing. In: Momirović, K., Mildner, V. (eds) Compstat. Physica-Verlag HD. https://doi.org/10.1007/978-3-642-50096-1_43
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DOI: https://doi.org/10.1007/978-3-642-50096-1_43
Publisher Name: Physica-Verlag HD
Print ISBN: 978-3-7908-0475-1
Online ISBN: 978-3-642-50096-1
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