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Kondensierte Schichten

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Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique

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Zusammenfassung

Die vorliegenden Versuche schließen an Untersuchungen an, die in unserem Institut von Sönksen (1) durchgeführt wurden. Hierin wurde festgestellt, daß die Kristallitgröße in Aufdampfschichten durch Vorbekeimung mit geringen Fremdsubstanzmengen entscheidend beeinflußt wird.

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Author information

Authors and Affiliations

  1. Institut für Angewandte Physik, Universität Hamburg, Deutschland

    W. Wilkens

  2. Laboratoire du C.N.R.S. Bellevue (S et O), France

    C. Sella, P. Conjeaud & J. J. Trillat

  3. Tube Investments Research Laboratories, Hinxton Hall, Hinxton, Nr. Saffron Walden, Essex, England

    G. A. Bassett

  4. Physikalisches Institut, Universität Münster/Westf, Deutschland

    Ludwig Reimer & Manfred Aust

  5. Cavendish Laboratory, University of Cambridge, England

    Anna Cosslett & V. E. Cosslett

  6. Physikalisch-Technische Bundesanstalt, Braunschweig, Deutschland

    Karl-Joseph Hanszen

  7. Werkstoff-Hauptlaboratorium, Siemens & Halske AG, Karlsruhe, Deutschland

    E. Fuchs, A. Politycki & H. Pfisterer

Authors
  1. W. Wilkens
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  2. C. Sella
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  3. P. Conjeaud
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  4. J. J. Trillat
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  5. G. A. Bassett
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  6. Ludwig Reimer
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  7. Anna Cosslett
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  8. V. E. Cosslett
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  9. Karl-Joseph Hanszen
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  10. Manfred Aust
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  11. E. Fuchs
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  12. A. Politycki
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  13. H. Pfisterer
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Editor information

W. Bargmann G. Möllenstedt H. Niehrs D. Peters E. Ruska C. Wolpers

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© 1960 Springer-Verlag OHG. Berlin · Göttingen · Heidelberg

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Wilkens, W. et al. (1960). Kondensierte Schichten. In: Bargmann, W., Möllenstedt, G., Niehrs, H., Peters, D., Ruska, E., Wolpers, C. (eds) Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-49765-0_27

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  • DOI: https://doi.org/10.1007/978-3-642-49765-0_27

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-49481-9

  • Online ISBN: 978-3-642-49765-0

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