Abstract
Extended x-ray absorption fine structure was measured at K edges of both elements in InAs and GaAs. The measurements were made at SSRL (Stanford Synchrotron Radiation Laboratory) during dedicated runs. The samples were measured at three temperatures (80 K, 180 K, and room temperature) to determine the temperature dependency of the disorders.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsReferences
E.A. Stern, B.A. Bunker, and S.M. Heald: Phys. Rev. B 21, 5521 (1982)
O. Keski-Rahkonen and M.O. Krause: Atomic Data and Nuclear Data Tables 14, 139 (1974)
J.E. Müller and W.L. Schaich: Phys. Rev. B 27, 6489 (1983)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1984 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Kim, K., Stern, E.A. (1984). Many-Body Effects on EXAFS Amplitudes. In: Hodgson, K.O., Hedman, B., Penner-Hahn, J.E. (eds) EXAFS and Near Edge Structure III. Springer Proceedings in Physics, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-46522-2_5
Download citation
DOI: https://doi.org/10.1007/978-3-642-46522-2_5
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-46524-6
Online ISBN: 978-3-642-46522-2
eBook Packages: Springer Book Archive