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In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy

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Book cover In-situ Materials Characterization

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 193))

Abstract

The need to visualize molecular and electronic structure in the course of a chemical reaction, a phase transformation a biological function has been the dream of scientists for decades. The development of time-resolved X-ray and electron based methods is making this true. X-ray absorption spectroscopy is ideal for the study of structural dynamics in liquids, because it can be implemented in amorphous media and it is chemically selective. Using X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) in laser pump/X-ray probe experiments allows the retrieval of the local geometric structure of the system under study, but also the underlying photoinduced electronic structure changes that drive the structural dynamics. We review the recent development in picosecond and femtosecond X-ray absorption spectroscopy applied to molecular systems in solution: examples on ultrafast photoinduced processes such as intramolecular electron transfer, high-to-low spin change, bond formation and water dynamics are presented.

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Acknowledgments

Deep thanks to all my co-workers who have contributed to the various studies presented here, and in particular to Ch. Bressler, C. Milne, W. Gawelda, V.-T. Pham, R. M. van der Veen, T. Penfold and F. van Mourik. We also acknowledge the great collaboration with the team at the MicroXAS beamline of the Swiss Light Source (PSI, Villigen): S. Johnson, P. Beaud, D. Grolimund, C. N. Borca, G. Ingold and R. Abela. Many thanks to M. Benfatto, P. D’Angelo (Rome), I. Tavernelli (Lausanne) and A. Hauser (Geneva) for useful discussions and samples.

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Chergui, M. (2014). In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy. In: Ziegler, A., Graafsma, H., Zhang, X., Frenken, J. (eds) In-situ Materials Characterization. Springer Series in Materials Science, vol 193. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-45152-2_1

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