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New Insights into Ferroelectric Domain Imaging with Piezoresponse Force Microscopy

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Ferroelectric Crystals for Photonic Applications

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 91))

Abstract

Piezoresponse Force Microscopy (PFM) has become the most used technique for non-invasive mapping of ferroelectric domain patterns. For PFM imaging, no specific sample preparation is required: any clean and flat surface that can be imaged by scanning force microscopy can also be investigated by PFM. Despite its ease of use, PFM imaging allows to detect the domain distribution with high lateral resolution and an amazing sensitivity. As a consequence, the PFM mode has become a standard for commercial scanning force microscopes. PFM, however, still causes difficulties in terms of interpretation of the images obtained. The situation becomes even more delicate, when trying to obtain quantitative data based on PFM images.

In this chapter, we intend to provide a deeper insight into PFM imaging and thereby permit a more reliable interpretation of PFM images. For this purpose we point to a couple of difficulties that one may encounter in PFM imaging, possibly leading to aha moments of the reader about having seen such PFM images without having been able to make sense of it, and propose solutions to the most common challenges, such as calibration to name the most prominent one.

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Authors and Affiliations

  1. Institute of Physics, University of Bonn, Wegelerstr. 8, 53115, Bonn, Germany

    Tobias Jungk, Ákos Hoffmann & Elisabeth Soergel

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  1. Tobias Jungk
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  2. Ákos Hoffmann
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  3. Elisabeth Soergel
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Correspondence to Elisabeth Soergel .

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Editors and Affiliations

  1. CNR National Institute of Optics, Pozzuoli, Napoli, Italy

    Pietro Ferraro

  2. CNR National Institute of Applied Optics, Pozzuoli, Napoli, Italy

    Simonetta Grilli

  3. CNR National Institute of Optics, Arcetri, Napoli, Italy

    Paolo De Natale

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Jungk, T., Hoffmann, Á., Soergel, E. (2014). New Insights into Ferroelectric Domain Imaging with Piezoresponse Force Microscopy. In: Ferraro, P., Grilli, S., De Natale, P. (eds) Ferroelectric Crystals for Photonic Applications. Springer Series in Materials Science, vol 91. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-41086-4_8

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