TEM for Characterization of Nanowires and Nanorods

  • Sarah K. St. AngeloEmail author


Transmission electron microscopy (TEM) and related techniques allow for imaging of nanomaterials to determine the material size, shape, composition, and crystal structure. In situ TEM measurements allow for observation of dynamic processes, such as nanowire growth. This chapter describes the application of ex situ and in situ TEM techniques to the analysis of nanowires/nanorods as a subset of nanomaterials. Nanowires refer to anisotropic metal, semiconductor, metal oxide, and/or alloyed structures that may be cylindrical solids, core-shell structures, or hollow tube-like structures. Herein, “bottom-up” nanowires – those synthesized by monomer addition or particle aggregation – are considered for how their analyses may be aided by TEM-based techniques. Lithographically defined wire-like structures, carbon nanotubes, and graphene-based scroll structures are not considered in this chapter.


Scanning Tunneling Microscopy Liquid Cell Nanowire Growth Transmission Electron Microscopy Technique Kirkendall Effect 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



Sarah K. St. Angelo acknowledges support from the Dickinson College Research & Development Committee.


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Copyright information

© Springer-Verlag Berlin Heidelberg 2014

Authors and Affiliations

  1. 1.Department of ChemistryDickinson CollegeCarlisleUSA

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