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Transmission Electron Microscopy Characterization of Nanomaterials pp 89–138Cite as

TEM for Characterization of Semiconductor Nanomaterials

Abstract

Transmission electron microscopy provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution. In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.

Keywords

  • HRTEM Image
  • Scanning Transmission Electron Microscopy
  • Convergent Beam Electron Diffraction
  • Scanning Transmission Electron Microscopy Image
  • Primary Electron Beam

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Acknowledgments

I would like to thank Alfonso Franciosi for the many inspiring discussions, Regina Ciancio for the careful reading of the paper and Ezio Cociancich for the help in the realization of some of the figures of the chapter.

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  1. Centro di Microscopia Elettronica – Consiglio Nazionale delle Ricerche – Istituto di Officina dei Materiali (CNR-IOM-TASC), Blg. MM Area Science Park Basovizza – SS 14, 34149, Trieste, Italy

    Elvio Carlino

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    Challa S.S.R. Kumar

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Carlino, E. (2014). TEM for Characterization of Semiconductor Nanomaterials. In: Kumar, C. (eds) Transmission Electron Microscopy Characterization of Nanomaterials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38934-4_3

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