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TEM for Characterization of Semiconductor Nanomaterials

  • Elvio CarlinoEmail author
Chapter

Abstract

Transmission electron microscopy provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution. In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.

Keywords

HRTEM Image Scanning Transmission Electron Microscopy Convergent Beam Electron Diffraction Scanning Transmission Electron Microscopy Image Primary Electron Beam 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

I would like to thank Alfonso Franciosi for the many inspiring discussions, Regina Ciancio for the careful reading of the paper and Ezio Cociancich for the help in the realization of some of the figures of the chapter.

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© Springer-Verlag Berlin Heidelberg 2014

Authors and Affiliations

  1. 1.Centro di Microscopia Elettronica – Consiglio Nazionale delle Ricerche – Istituto di Officina dei Materiali (CNR-IOM-TASC)TriesteItaly

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