Abstract
Step-stress accelerated degradation test (SSADT), plays an important role in evaluating the storage life and reliability of the equipment products with high reliability and long life. Traditional models for step-stress tests have largely relied on the cumulative exposure model (CEM) where the hazard function has discontinuities at the points at which the stress levels are changed. Based on lagged effect a new step-stress model where the hazard function is continuous is introduced. The hazard function is assumed to be constant at the two stress levels, and linear in the intermediate period. The lagged step-stress model with the cumulative risk model (CRM) is deduced and obtained by the maximum likelihood estimation of the unknown parameters in terms of the hazard function. The new model shows its excellent fit and obtained reliability function at last.
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Acknowledgments
I would like to thank the author’s mentor Yao Jinyong for guiding and modifying carefully. I also thank classmates and other teachers for helping and supporting. Finally, I thank all the authors of the references for the elicitation of research methods.
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Yao, Jy., Luo, Rm. (2013). Step-Stress Accelerated Degradation Test Model of Storage Life Based on Lagged Effect for Electronic Products. In: Qi, E., Shen, J., Dou, R. (eds) The 19th International Conference on Industrial Engineering and Engineering Management. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38433-2_59
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DOI: https://doi.org/10.1007/978-3-642-38433-2_59
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