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A Comparison of the Modified Likelihood-Ratio-Test-Based Shewhart and EWMA Control Charts for Monitoring Binary Profiles

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The 19th International Conference on Industrial Engineering and Engineering Management
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Abstract

Profile monitoring is used to check and evaluate the stability of the functional relationship between a response variable and one or more explanatory variables known as profile over time. Many studies assume that the response variable follows a continuous and normal distribution, while in fact it could be discrete, for example binary profiles. However, at present, there are few researches in this field. Based on an in-control binary dataset, this paper uses the logistic regression model to estimate the parameters in Phase I. And in Phase II, we apply bi-sectional search method to modifying the UCL’s calculation of the likelihood-ratio-test-based Shewhart and EWMA control charts. Moreover, according to the estimated parameters, ARL’s performances of the two modified control charts under different parameters’ deviation are compared.

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References

  • Amiri A, Jensen W, Kazemzadeh RB (2009) A case study on monitoring polynomial profiles in the automotive industry. Qual Reliab Eng Int 26:509–520

    Article  Google Scholar 

  • Eric C, Joseph J, Simpson J (2009) Statistical process monitoring of nonlinear profiles using wavelets. J Qual Technol 41:198–212

    Google Scholar 

  • Kazemzadeh RB, Noorossana R, Amiri A (2009) Monitoring polynomial profiles in quality control applications. Int J Adv Manuf Technol 42:703–712

    Article  Google Scholar 

  • Kim K, Mahmoud MA, Woodall WH (2003) On the monitoring of linear profiles. J Qual Technol 35:317–328

    Google Scholar 

  • Koosha M, Amiri A (2011a) The effect of neglecting autocorrelation on the performance of T2 control charts in monitoring of logistic profiles. In: ICQR 2011, pp 264–267

    Google Scholar 

  • Koosha M, Amiri A (2011b) The effect of link function on the monitoring of logistic regression profiles. In: WCE 2011, pp 326–328

    Google Scholar 

  • Koosha M, Amiri A (2012) Generalized linear mixed model for monitoring autocorrelated logistic regression profiles. Int J Adv Manuf Technol 64:487–495

    Google Scholar 

  • Mahmoud MA, Woodall WH (2004) Phase I analysis of linear profiles with calibration applications. Technometrics 46:380–391

    Article  Google Scholar 

  • Williams JD, Woodall WH, Birch JB (2007) Statistical monitoring of nonlinear product and process quality profiles. Qual Reliab Eng Int 23:925–941

    Article  Google Scholar 

  • Yeh AB, Huwang LC, Wu YF (2004) A likelihood ratio based EWMA control chart for monitoring variability of multivariate normal processes. IIE Trans 36:865–879

    Article  Google Scholar 

  • Yeh AB, Huwang LC, Li YM (2009) Profile monitoring for a binary response. IIE Trans 41:931–941

    Article  Google Scholar 

  • Yu D, Li Z, Zhou SY (2006) Phase I analysis for monitoring nonlinear profiles in manufacturing processes. J Qual Technol 38:199–216

    Google Scholar 

  • Zhou JJ, Lin D (2010) Monitoring the slopes of linear profiles. Qual Eng 22:1–12

    Article  Google Scholar 

  • Zhu JJ (2008) Essays on monitoring profile data. The Pennsylvania State University

    Google Scholar 

  • Zou CL, Fugee T, Wang ZJ (2007) Monitoring general linear profiles using multivariate exponentially weighted moving average schemes. Technometrics 49:395–408

    Article  Google Scholar 

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Correspondence to Chao Yin .

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Yin, C., He, Y., Shen, Z., Wu, Ch. (2013). A Comparison of the Modified Likelihood-Ratio-Test-Based Shewhart and EWMA Control Charts for Monitoring Binary Profiles. In: Qi, E., Shen, J., Dou, R. (eds) The 19th International Conference on Industrial Engineering and Engineering Management. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38391-5_3

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