X-Ray Reflectivity

  • Andrei BenediktovitchEmail author
  • Ilya Feranchuk
  • Alexander Ulyanenkov
Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 183)


The general calculation of the scattered from the sample X-ray intensity requires the solution of the Eq. (2.1). However, the geometry of the experiment has to be also taken into account, because of the mutual arrangement of the X-ray source, the sample and the detector as well as the shape of the sample influence the observed results.


Reflection Coefficient Transfer Matrix Wave Field Transition Layer Diffuse Scattering 
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Copyright information

© Springer-Verlag Berlin Heidelberg 2014

Authors and Affiliations

  • Andrei Benediktovitch
    • 1
    Email author
  • Ilya Feranchuk
    • 1
  • Alexander Ulyanenkov
    • 2
  1. 1.Physics DepartmentBelarusian State UniversityMinskBelarus
  2. 2.Rigaku Europe SEEttlingenGermany

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