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Surface Spectroscopy by Scanning Tunneling Microscope

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Photoelectron Spectroscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 176))

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Abstract

The studies of micro and nano materials from the view point of topography and electronic structure are now very important for applications. Some techniques are already explained in Sect. 3.6.d. For topographic imaging of nano-materials, atomic force microscopy (AFM) as well as scanning tunneling microscopy (STM) are widely applied. In the case of magnetic materials, magnetic force miscroscopy (MFM) and spin-polarized STM techniques are applicable. In MFM, the magnetic stray field is probed by a magnetically covered pyramidal tip [1].

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Authors and Affiliations

  1. Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka, 567-0047, Japan

    Shigemasa Suga

  2. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka, 560-8531, Japan

    Akira Sekiyama

Authors
  1. Shigemasa Suga
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  2. Akira Sekiyama
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Correspondence to Shigemasa Suga .

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Suga, S., Sekiyama, A. (2014). Surface Spectroscopy by Scanning Tunneling Microscope. In: Photoelectron Spectroscopy. Springer Series in Optical Sciences, vol 176. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-37530-9_14

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  • DOI: https://doi.org/10.1007/978-3-642-37530-9_14

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-37529-3

  • Online ISBN: 978-3-642-37530-9

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