Abstract
Phase reconstruction from intensity measurements in interferometry is classically solved by phase-shifting or phase-stepping techniques. At each pixel a sequence (set) of intensity measurements is taken, and between those measurements the bias phase is changed in a most precise manner (i.e. "phase-stepping"). High accuracy of the computed phases in each pixel is achieved by knowing the individual intensities but especially also the global bias-phase of every interferogram in the set. The obvious problem, that the bias-phase is a delicate quantity, highly error prone due to vibrations, air-turbulence and wavelength-instability of the laser has conventionally been tried to address by special phase-shifting formulas [1-6]. These enable correct phase reconstruction even with linear or quadratic phase-stepping errors as well as with non-linearity of the characteristic detector curve and also mitigate the effect of multiple reflections within the Fizeau-cavity.
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Küchel, M.F. (2014). Quasi Ellipse Method Enabling High Accuracy Phase Reconstruction with Random Phase Steps in Fizeau-Interferometers. In: Osten, W. (eds) Fringe 2013. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36359-7_9
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DOI: https://doi.org/10.1007/978-3-642-36359-7_9
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