Abstract
Calculating the propagation, refraction, and reflection of wavefronts does not only allow for the simulation of the behaviour of a given system of optical components, objects, and lights sources but also for the analysis of an actual optical system or component by measuring wavefronts of known origin. Thus the methods of wavefront tracing are used widely in a large range of application ranging from system design to quality inspection.
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References
Esser, G., Becken, W., Müller, W., Baumbach, P., Arasa, J., Uttenweiler, D.: Derivation of the propagation equations for higher order aberrations of local wavefronts. J. Opt. Soc. Am. A 28, 2442–2553 (2011)
Esser, G., Becken, W., Müller, W., Baumbach, P., Arasa, J., Uttenweiler, D.: Derivation of the refractive equations for higher order aberrations of local wavefronts by oblique incidence. J. Opt. Soc. Am. A 27, 218–237 (2010)
Esser, G., Becken, W., Müller, W., Baumbach, P., Arasa, J., Uttenweiler, D.: Derivation of the reflective equations for higher order aberrations of local wavefronts. Advances in in Imaging and Electron Physics 171, 1–39 (2012)
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Trumm, S., Esser, G., Becken, W., Müller, W. (2014). Novel Analytical Method of Wavefront Tracing and Its Application in Ophthalmic Optics. In: Osten, W. (eds) Fringe 2013. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36359-7_51
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DOI: https://doi.org/10.1007/978-3-642-36359-7_51
Publisher Name: Springer, Berlin, Heidelberg
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