Abstract
Electronic speckle pattern interferometry (ESPI) is a well-known, nondestructive, whole-field optical technique for measurement. It has been extensively investigated and widely used for deformation measurements in numerous fields. The deformation to be measured is coded in a fringe pattern. Computer-aided fringe analysis can be used for quantitatively evaluating deformation information. However ESPI fringe pattern is contaminated by heavy speckle noise, which makes the fringe analysis difficult.
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Yan, S., Zhu, X., Tang, C., Yan, H. (2014). A TVSOOPDE Model for Denoising Fringe Pattern in Electronic Speckle Pattern Interferometry. In: Osten, W. (eds) Fringe 2013. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36359-7_39
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DOI: https://doi.org/10.1007/978-3-642-36359-7_39
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-36358-0
Online ISBN: 978-3-642-36359-7
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