Abstract
A phase space based NBTI model that relies upon the well-known reaction-diffusion model is introduced. Temporal shift in threshold voltage and a new parameter called “healability” are used to characterize the state of the NBTI effect. The NBTI degradation is then simulated as a trace of the interpolated characterization parameters. Thereby, healability is crucial for the success of the model. The phase space based model is well suitable in performance oriented use cases, since a small deterioration of the simulation results comes with a vastly improved simulation speed. The additional phase space dimensions of temperature and supply voltage in combination with the conversion between duty cycle and supply voltage permit a performance efficient way to simulate NBTI degradation for complete circuits without disregarding power gating, temperature profiles and the IR drop.
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Eilers, R., Metzdorf, M., Rosinger, S., Helms, D., Nebel, W. (2013). Phase Space Based NBTI Model. In: Ayala, J.L., Shang, D., Yakovlev, A. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2012. Lecture Notes in Computer Science, vol 7606. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36157-9_6
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DOI: https://doi.org/10.1007/978-3-642-36157-9_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-36156-2
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