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Dynamic Force Microscopy

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Applied Scanning Probe Methods

Part of the book series: NanoScience and Technology ((NANO))

Abstract

This chapter is an introduction to the concept of the dynamic mode of the atomic force microscope (AFM). While the first part is dedicated towards a systematic discussion of the different operational modes in dynamic AFM, some practical issues for the experimentalist are pointed out. Special care is taken to explain the quantitative relation of the experimental parameters with the physical magnitudes, like force and dissipation.

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Authors
  1. André Schirmeisen
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  2. Boris Anczykowski
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  3. Harald Fuchs
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© 2004 Springer-Verlag Berlin Heidelberg

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Schirmeisen, A., Anczykowski, B., Fuchs, H. (2004). Dynamic Force Microscopy. In: Applied Scanning Probe Methods. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-35792-3_1

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