Off-Line Test Case Generation for Timed Symbolic Model-Based Conformance Testing

  • Boutheina Bannour
  • Jose Pablo Escobedo
  • Christophe Gaston
  • Pascale Le Gall
Part of the Lecture Notes in Computer Science book series (LNCS, volume 7641)


Model-based conformance testing of reactive systems consists in taking benefit from the model for mechanizing both test data generation and verdicts computation. On-line test case generation allows one to apply adaptive on-the-fly analyzes to generate the next inputs to be sent and to decide if observed outputs meet intended behaviors. On the other hand, in off-line approaches, test suites are pre-computed from the model and stored under a format that can be later performed on test-beds. In this paper, we propose a two-passes off-line approach where: for the submission part, a test suite is a simple timed sequence of numerical input data and waiting delays, and then, the timed sequence of output data is post-processed on the model to deliver a verdict. As our models are Timed Output Input Symbolic Transition Systems, our off-line algorithms involve symbolic execution and constraint solving techniques.


Model-based testing off-line testing real-time systems test suite generation verdict computation symbolic execution timed output-input symbolic transition systems 


  1. 1.
    Alur, R., Dill, D.L.: The Theory of Timed Automata. In: Huizing, C., de Bakker, J.W., Rozenberg, G., de Roever, W.-P. (eds.) REX 1991. LNCS, vol. 600, Springer, Heidelberg (1992)Google Scholar
  2. 2.
    Andrade, W.L., Machado, P.D.L., Jéron, T., Marchand, H.: Abstracting Time and Data for Conformance Testing of Real-Time Systems. In: Proc. of Int. Conf. Software Testing, Verification and Validation (ICSTW) Workshops. IEEE (2011)Google Scholar
  3. 3.
    Bannour, B., Gaston, C., Servat, D.: Eliciting unitary constraints from timed Sequence Diagram with symbolic techniques: application to testing. In: Proc. of Int. Conf. Asia-Pacific Software Engineering Conference (APSEC). IEEE (2011)Google Scholar
  4. 4.
    Bertrand, N., Jéron, T., Stainer, A., Krichen, M.: Off-Line Test Selection with Test Purposes for Non-deterministic Timed Automata. In: Abdulla, P.A., Leino, K.R.M. (eds.) TACAS 2011. LNCS, vol. 6605, pp. 96–111. Springer, Heidelberg (2011)CrossRefGoogle Scholar
  5. 5.
    Bohnenkamp, H.C., Belinfante, A.: Timed Testing with TorX. In: Fitzgerald, J.S., Hayes, I.J., Tarlecki, A. (eds.) FM 2005. LNCS, vol. 3582, pp. 173–188. Springer, Heidelberg (2005)CrossRefGoogle Scholar
  6. 6.
    Briones, L.B., Brinksma, E.: A Test Generation Framework for quiescent Real-Time Systems. In: Grabowski, J., Nielsen, B. (eds.) FATES 2004. LNCS, vol. 3395, pp. 64–78. Springer, Heidelberg (2005)CrossRefGoogle Scholar
  7. 7.
    Escobedo, J.P., Gaston, C., Le Gall, P.: Timed Conformance Testing for Orchestrated Service Discovery. In: Proc. of Int. Conf. Formal Aspects of. Component Software (FACS). Springer (2011)Google Scholar
  8. 8.
    Gaston, C., Le Gall, P., Rapin, N., Touil, A.: Symbolic Execution Techniques for Test Purpose Definition. In: Uyar, M.Ü., Duale, A.Y., Fecko, M.A. (eds.) TestCom 2006. LNCS, vol. 3964, pp. 1–18. Springer, Heidelberg (2006)CrossRefGoogle Scholar
  9. 9.
    Krichen, M., Tripakis, S.: Black-box time systems. In: Proc. of Int. SPIN Workshop Model Checking of Software. Springer (2004)Google Scholar
  10. 10.
    Marre, B., Arnould, A.: Test Sequences Generation from LUSTRE Descriptions: GATeL. In: Proc. of Int. Conf. Automated Software Engineering (ASE). IEEE (2000)Google Scholar
  11. 11.
    Petrenko, A., Yevtushenko, N.: Testing from Partial Deterministic FSM Specifications. IEEE Trans. Comput. (2005)Google Scholar
  12. 12.
    Rapin, N., Gaston, C., Lapitre, A., Gallois, J.-P.: Behavioural unfolding of formal specifications based on communicating automata. In: Proc. of Workshop on Automated technology for verification and analysis, ATVA (2003)Google Scholar
  13. 13.
    Rusu, V., du Bousquet, L., Jéron, T.: An Approach to Symbolic Test Generation. In: Grieskamp, W., Santen, T., Stoddart, B. (eds.) IFM 2000. LNCS, vol. 1945, pp. 338–357. Springer, Heidelberg (2000)CrossRefGoogle Scholar
  14. 14.
    Schmaltz, J., Tretmans, J.: On Conformance Testing for Timed Systems. In: Cassez, F., Jard, C. (eds.) FORMATS 2008. LNCS, vol. 5215, pp. 250–264. Springer, Heidelberg (2008)CrossRefGoogle Scholar
  15. 15.
    von Styp, S., Bohnenkamp, H., Schmaltz, J.: A Conformance Testing Relation for Symbolic Timed Automata. In: Chatterjee, K., Henzinger, T.A. (eds.) FORMATS 2010. LNCS, vol. 6246, pp. 243–255. Springer, Heidelberg (2010)CrossRefGoogle Scholar

Copyright information

© IFIP International Federation for Information Processing 2012

Authors and Affiliations

  • Boutheina Bannour
    • 1
  • Jose Pablo Escobedo
    • 2
  • Christophe Gaston
    • 2
  • Pascale Le Gall
    • 3
  1. 1.Sherpa EngineeringLa Garenne ColombesFrance
  2. 2.CEA LISTGif-sur-YvetteFrance
  3. 3.Laboratoire MASChâtenay-MalabryFrance

Personalised recommendations