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An Improved Memetic Algorithm and its Application in Multi-Constrained Test Paper Generation

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Proceedings of the 2012 International Conference on Information Technology and Software Engineering

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 211))

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Abstract

In order to improve the quality of intelligent test paper generation, an improved Memetic Algorithm (MA) is proposed as the strategy for intelligent test paper generation in this paper, which is based on Particle Swarm Optimizer (PSO) and Simulated Annealing (SA) (referred to as PMemetic). PMemetic takes PSO as the global search strategy while SA as the local search strategy. The mathematical models corresponding to the constraints for test paper generation and difficulty distribution functions and test paper generation model of PMemetic are established. The experimental analysis indicates that the method is effective, feasible and practical for test paper generation.

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Correspondence to Zhihao Wang or Xiangwei Zheng .

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Wang, Z., Zheng, X. (2013). An Improved Memetic Algorithm and its Application in Multi-Constrained Test Paper Generation. In: Lu, W., Cai, G., Liu, W., Xing, W. (eds) Proceedings of the 2012 International Conference on Information Technology and Software Engineering. Lecture Notes in Electrical Engineering, vol 211. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34522-7_53

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  • DOI: https://doi.org/10.1007/978-3-642-34522-7_53

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-34521-0

  • Online ISBN: 978-3-642-34522-7

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