Abstract
In this chapter, we treat the piezoelectrically modulated resistive switching device based on a piezotronic nanowire, through which the write/read access of the memory cell is programmed via electromechanical modulation. Adjusted by the strain-induced polarization charges created at the semiconductor/metal interface under externally applied deformation by the piezoelectric effect, the resistive switching characteristics of the cell can be modulated in a controlled manner, and the logic levels of the strain stored in the cell can be recorded and read out, which has the potential for integrating with NEMS technology to achieve micro/nanosystems capable for intelligent and self-sufficient multidimensional operations.
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Wang, Z.L. (2012). Piezotronic Electromechanical Memories. In: Piezotronics and Piezo-Phototronics. Microtechnology and MEMS. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34237-0_6
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DOI: https://doi.org/10.1007/978-3-642-34237-0_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-34236-3
Online ISBN: 978-3-642-34237-0
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