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Cross-Channel Co-occurrence Matrices for Robust Characterization of Surface Disruptions in 21/2D Rail Image Analysis

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Part of the Lecture Notes in Computer Science book series (LNIP,volume 7517)

Abstract

We present a new robust approach to the detection of rail surface disruptions in high-resolution images by means of 21/2D image analysis. The detection results are used to determine the condition of rails as a precaution to avoid breaks and further damage. Images of rails are taken with color line scan cameras at high resolution of about 0.2 millimeters under specific illumination to enable 21/2D image analysis. Pixel locations fulfilling the anti-correlation property between two color channels are detected and integrated over regions of general background deviations using so called cross-channel co-occurrence matrices, a novel variant of co-occurrence matrices introduced as part of this work. Consequently, the detection of rail surface disruptions is achieved with high precision, whereas the unintentional elimination of valid detections in the course of false and irrelevant detection removal is reduced. In this regard, the new approach is more robust than previous methods.

Keywords

  • Surface Disruption
  • Pixel Pair
  • Rolling Contact Fatigue
  • Photometric Stereo
  • Ground Truth Information

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

This work is supported by the Austrian Federal Ministry for Transport, Innovation and Technology BMVIT, program line I2V ”Intermodalität und Interoperabilität von Verkehrssystemen”, project fractINSPECT.

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© 2012 Springer-Verlag Berlin Heidelberg

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Soukup, D., Huber-Mörk, R. (2012). Cross-Channel Co-occurrence Matrices for Robust Characterization of Surface Disruptions in 21/2D Rail Image Analysis. In: Blanc-Talon, J., Philips, W., Popescu, D., Scheunders, P., Zemčík, P. (eds) Advanced Concepts for Intelligent Vision Systems. ACIVS 2012. Lecture Notes in Computer Science, vol 7517. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-33140-4_15

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  • DOI: https://doi.org/10.1007/978-3-642-33140-4_15

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-33139-8

  • Online ISBN: 978-3-642-33140-4

  • eBook Packages: Computer ScienceComputer Science (R0)