Optimization of Test Points at Circuit Board Based on Network Topology Structure

  • Ying Liu
  • HaiLiang Ma
  • FangJun Zhou
Conference paper
Part of the Advances in Intelligent and Soft Computing book series (AINSC, volume 169)

Abstract

Selection of test points is the foundation of fault diagnosis for circuit board. On the basis that test point set includes fault source information as far as possible, principle of optimized selection for test point is expanded in this paper. Optimal test point set of complicated system is generated by use of improved association matrix for circuit board.

Keywords

Circuit board fault diagnosis improved association matrix optimized selection 

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Copyright information

© Springer-Verlag GmbH Berlin Heidelberg 2012

Authors and Affiliations

  • Ying Liu
    • 1
  • HaiLiang Ma
    • 2
  • FangJun Zhou
    • 3
    • 4
  1. 1.College of Electric and Information EngineeringNaval University of EngineeringWuhanChina
  2. 2.The Equipment Research Institute of PLA’s Second ArtilleryBeijingChina
  3. 3.College of Naval Architecture & PowerNaval University of EngineeringWuhanChina
  4. 4.College of Naval Architecture & PowerNaval University of EngineeringLüshunChina

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